What type of Self-Test features is available with the QRS116?
The Model QRS116 Quartz Rate Sensor incorporates dual self-test circuitry to determine the functionality of the unit, for both monitoring and for failure detection. An individual Built-In-Test (BIT) signal is produced by the drive system. The BIT Output signal provides a continuous monitor indicating that the QRS116 sensing element is functioning properly. To provide a definitive test of the remainder of the signal processing circuitry, and Initiated BIT input terminal is provided. By grounding this pin, the specified change in the Rate Output will indicate that the entire signal processing chain within the QRS is performing properly.
