What metrology capabilities exist at Engineered Surface Finishes and its parent company, Cabot Microelectronics Corporation (CMC)?
A very wide variety of metrology tools are available on-site at ESF and CMC for characterization work. These tools include atomic force microscopes, a scanning electron microscope with EDX, an optical profiler, high resolution digital microscope, film thickness tools, flatness measurement capabilities, optical surface analyzers and several other sophisticated metrology devices.
