What is the structure of the 300-1D, 300-2D, 700-1D and 700-2D calibration specimens?
These calibration specimens are fabricated using a silicon wafer substrate which is overcoated with a polymer material. A precision, laser-generated, interference pattern is recorded in this material and then overcoated with about 50 nm of tungsten. This provides a reasonably durable coating and an electrically conductive path to ground. The (-1D) specimen pattern consists of ridges and the (-2D) specimen pattern consists of posts.