What is the index of refraction of my film?
Here are some published values of index of refraction for several semiconductor materials: Material 950 nm Index 470 nm Index Silicon 3.67 +i0.005 4.32 + i0.07 GaAs 3.54 + 0.08 4.33 + i0.44 Ge 4.65 + i0.3 4.3 + i2.4 AlAs 2.974 + i0.00 3.51 + i0.00 GaSb 4.3 + i0.34 4.3 + i2.3 InAs 3.7 + i0.43 4.3 + i1.8 InP 3.37 + i0.2 3.818 + i0.5 InSb 4.42 + i0.64 3.57 + i2.2 GaP 3.17 +i0.00 3.6 + i0.01 GaN 2.37 + i0.00 2.47 + i0.00 These values are obtained from the Palik database (Handbook of Optical Constants of Solids, Edward D. Palik, Academic Press, First edition 1985, 2nd Edition 1991) and the Landolt-Bornstein tables (Semiconductors: Group IV Elements and III-V compounds, O. Madelung ed., Springer-Verlag, 1991). The data for GaAs is based on ellipsometry measurements by Aspnes et. al. (Phys. Rev. B 27, p. 985 (1983).