What is an Integrated Multi-system Architecture, or IMA?
IMA is an ATE architecture enabling the creation, on the production floor, of large tester arrays utilizing compact, lower cost test systems. Further, IMA tester arrays can be rapidly reconfigured back into individual test cells to address the constantly shifting capacity needs of semiconductor production. Allowing the ultimate in flexibility, IMA tester arrays eliminate the need to purchase physically large, high pin count systems for test resource intensive applications. IMA arrays enable semiconductor manufacturers to adopt the most cost effective manufacturing test strategies for the complete range of SoC and SiP applications. Diamond – The First IMA Compliant Test System The first LTX-Credence offering using IMA is the Diamond platform. As an example, an IMA tester array using three air-cooled Diamond test systems will provide test capability up to 2,400 digital/analog pins, in a footprint one half the floor space compared to traditional high pin count platforms. Diamond IMA array
