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What is a MultiScan AFP probe?

AFP multiscan probe
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What is a MultiScan AFP probe?

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The MultiScan AFP probe is the world’s highest resolution contact nanoprobing tool which permits imaging of nano-scale circuit features without damage, while allowing enough contact force to make secure and reliable node contacts for accurate test measurements. The AFP consists of an AFM head specialized for use with robust solid tungsten probe needles. The MultiScan user interface allows the operator to simultaneously control and probe with multiple heads.

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