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What are the main problems facing the introduction of wafer level burn-in as an industry standard?

April 26, 2017burn-in facing Industry introduction level main problems standard wafer

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What are the main problems facing the introduction of wafer level burn-in as an industry standard?

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The benefits of performing test at the wafer level are significant but this is a new technology and we are faced with several hurdles to ensure the process of performing the burn-in test does not introduce failures.