What are some of the applications of the semiconductor line of nanoprobers?
The sProber, dProber, and nProber are all used extensively for non-visual fault localization. They can also be used for device characterization, metal-line resistance measurements, butterfly probing, and bitcell characterization. They can be further upgraded to perform hot/cold measurements, CV characterization, Pulsing measurements, and Electron Beam Induced/Absorbed Current characterization. The tools are used at all metal layers and at the contact level to characterize and find faults.
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