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We are studying structures of thin metal films deposited on silicon by XPS. Would the QUASES software be suited for our analysis?

deposited films metal Silicon Software structures suited XPS
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We are studying structures of thin metal films deposited on silicon by XPS. Would the QUASES software be suited for our analysis?

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Concerning the morphology of the deposits I would appreciate to see a comparison with STM and/or AFM results.

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