Is hipot testing destructive to my product?
No. When properly performed, hipot testing will not damage the device-under-test. The only purpose of the hipot test is to measure the strength of the insulating material that isolates the user-accessible parts of the device-under-test from its active circuitry. The active circuitry itself is not being driven during the test, unless there is a major internal wiring flaw inside the product being tested that could cause this. But even in this worst-case scenario all ROD-L units are designed to shut down within 2 milliseconds of a detected failure.
