How will capacitive coupling between the current path in the ACS710 and the Hall element affect the sensor IC output?
The leadframe noise rejection test is conducted by injecting a high-frequency sinusoidal frequency onto the high-current leads. The signal coupling onto the output of the Hall-effect device is then measured. The ACS710 family devices exhibit a high level of leadframe noise rejection as table 6 reveals. In addition, figure 15 indicates performance as a function of frequency.
