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How does a MultiProbe AFP II nanoprober improve productivity of the engineering staff?

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How does a MultiProbe AFP II nanoprober improve productivity of the engineering staff?

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The MultiProbe AFP II nanoprober system use of a closed-loop-positioning system coupled with AFM performance allows for the rapid imaging of deep-submicron features and ensures reliable contact with minimal set-up. This atmospheric solution makes submicron probing possible in any FA lab without the disadvantages of vacuum-based probing options.

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