How do I know what detector configuration (N x T) I am using if the scanner console doesn explicitly report that information?
In multi-detector-row CT (MDCT), the reconstructed slice thickness is not always the same as the Tomographic thickness of one data channel (T as defined in the ACR accreditation documents). For example, a given helical acquisition protocol on a GE MDCT scanner specifies the acquisition parameters in terms of “Thick, Speed and Mode or Pitch.” Here “Thick” refers to the reconstructed image thickness and not the underlying detector collimation (T). This definition of T is consistent with International Standards, but can be confusing because users also associate “T or t” with the image thickness. In MDCT, the two parameters are not the same and both are important to know. For ACR accreditation reporting and measurements, particularly the CTDI measurements and calculations, it is imperative that the physicists know the underlying detector configuration for any given helical protocol. Below we provide a conversion table for GE LightSpeed QX/i and LightSpeed Plus systems (4-detector-row scann
Related Questions
- Can the WiSI configuration console be used as an aid in setting up HMI screens by verifying remote WiSI values found in the Coordinator?
- How do I know what detector configuration (N x T) I am using if the scanner console doesn explicitly report that information?
- How to reconfigure database console configuration files without loosing configuration information within the repository?