How can I perform the Statistical processes on my semiconductor test data in Yield Power SQL ( semiconductor Defect Management Software )?
When the STDF file is uploaded then Yield Power automatically opens the Basic Test data Information form, you can view the complete data of uploaded STDF V3.0, STDF V4.0 files with automatically marked outliers in red color. Click on the Process Data button and the Yield Power will perform the statistical calculations on the data and will display the Statistical Analysis.
Related Questions
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