How can I Mark/Unmark outliers to analyze semiconductor test data in Yield Power SQL ( semiconductor Defect Management Software )?
when the STDF file is uploaded then Yield Power automatically opens the Basic Test data Information form, you can view the complete data of uploaded STDF V3.0, STDF V4.0 files with automatically marked outliers in red color. Here you can Mark/Unmark outliers manually. Click on the Mark Outlier button ( or Alt+M ) to mark any data elements as outliers. Whichever element you will marks as an outlier, with a mouse click, will be change to red indicating that the selected element is marked as an outlier. Click on the Unmark Outlier button ( or Alt +U ) to unmark any red colored outlier as normal element. Whichever element you will unmark, with a mouse click, will be change to automatic color indicating that the selected element is unmarked.
Related Questions
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- How can I Mark/Unmark outliers to analyze semiconductor test data in Yield Power SQL ( semiconductor Defect Management Software )?
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