How are the θJA and θJC measurements presented by Ecliptek determined?
The θJA and θJC values are determined through the use of empirical data, supplier data, and thermal simulation results. In some cases, the actual temperature rise and/or the actual junction temperature of a semiconductor device is known from testing. At other times, these parameters can be determined from certain factors that are known about the component or from information supplied by the vendor of the component. In cases where limited thermal information is known about a component, a standardized temperature rise for that component type may have been used.
