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Does the SDG500 have a Built-In-Test (BIT) Capability?

April 26, 2017bit built-in-test capability

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Does the SDG500 have a Built-In-Test (BIT) Capability?

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Yes, the BIT Output is available on Pin #10. The BIT is also referred to as the Tine Motion Detector (TMD) in the SDG500 User’s Guide. A Self-Test input is also available. The Self-Test is activitated by grounding Pin #8 to Signal Return (Pin #5) and monitoring the Rate Output (Pin #6) for a “step” voltage change of +1.5 Vdc. The voltage change indicates that the SDG500 is functioning properly.