Can EDA Help Solve Analog Test and DFT Challenges?
Stephen Sunter, Mentor Graphics This ITC panel was organized by Ramyanshu Datta of Texas Instruments and Stephen Sunter of Mentor Graphics, and moderated by Carl Moore of Maxim Integrated Products. Carl introduced the topic by asking about the challenges that EDA companies face in developing DFT automation for analog/mixed-signal (AMS) functions, the key issues for DFT and BIST, the solutions needed most urgently, and how effectiveness could be measured. Karim Arabi of Qualcomm observed that in his company’s chips, AMS circuitry typically occupies 20% of the area but incurs 70% of the test cost and 45% of the DFT/test effort, so more automation is needed. He warned that EDA should not try to automate DFT where design is not automated; should not solve only 80% of the problem; and should not use a fault model unless it is widely accepted. Craig Force of Texas Instruments emphasized the need for defect-oriented tests (DOT) that are correlated to performance tests, so that the latter can
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