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Are the resulting structures easily detectable in the finished devices?

April 26, 2017detectable Devices EASILY finished structures

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Are the resulting structures easily detectable in the finished devices?

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Yes. The change in the electrical character will be quite evident, and the atomic wrinkles can also be easily detected using either AFM (atomic force microscope), or with a bit more difficulty with cross-sectional STEM (scanning transmission electron microscopy). This easy detectability is important to enforcing a patent.